Emerging Electronic Device

Research Group

YONSEI UNIVERSITY

Publication

2025


81      Influence of oxidants on the characteristics of atomic layer deposited TiO2 thin films

J.H. Hwang, G.Y. Lee, J.J. Ryu, J.W. Choi, T.M.Chung, Y.Y. Kim, S.H. Oh, S. Park, Y. Kim, G.H. Kim*, T. Eom

Applied Surface Science 

https://doi.org/10.1016/j.apsusc.2025.163044

2024


80      “Structural Optimization of Chalcogenide Thin Films for Enhancing the Threshold Switching Performance”

J.J. Ryu, K. Jeon, H.K. Seo, T. Eom, M.K. Yang*, G.H. Kim*

ACS Applied Materials & Interfaces

https://doi.org/10.1021/acsami.4c15080 


79      Functional interface layer for a high-performance self-rectifying memristive device using hafnium-zirconia thin film

S.Y. Jeong, J. Jung, H.K. Seo, J.S. Jeong, J.H. Lee, G.H. Kim*, M.K. Yang

Results in Engineering

https://doi.org/10.1016/j.rineng.2024.102906


78      Al concentration-dependent electrical modulation of Al-doped ZnO thin f ilm using atomic layer deposition

J.W. Choi, J.J. Ryu, W. Song, G.H. Kim*, T.M. Chung

Ceramics International

https://doi.org/10.1016/j.ceramint.2024.09.132


77      Direct Growth of Bi2SeO5 Thin Films for High-k Dielectrics via Atomic Layer Deposition

H. Park, J.H. Hwang, S.H. Oh, J.J. Ryu, K. Jeon, M. Kang, H.J. Chai, A. Ham, G.H. Kim*, K. Kang*, T. Eom*

ACS Nano

https://doi.org/10.1021/acsnano.4c05273


76      Purely self-rectifying memristor-based passive crossbar array for artificial neural network accelerators

K. Jeon, J.J. Ryu, S. Im, H.K. Seo, T. Eom, H. Ju, M.K. Yang, D.S. Jeong, G.H. Kim*,

Nature Communications, Editor's pick, Featured article 

https://doi.org/10.1038/s41467-023-44620-1

2023


75      "Ag-dispersive chalcogenide media for readily activated electronic memristor"

S.Y. Lee, J.J. Ryu, H.K. Seo, H. Sohn, G.H. Kim*, M.K. Yang

Applied Surface Science 

https://doi.org/10.1016/j.apsusc.2023.158747 


74      "Optimized chalcogenide medium for inherently activated resistive switching device"

J.J. Ryu, K. Jeon, T. Eom, M.K. Yang, H. Sohn, G.H. Kim*

Applied Surface Science 

https://doi.org/10.1016/j.apsusc.2023.158444 


73      "Effect of Electrode Material on the Polarization Switching Kinetics of Hf0.5Zr0.5O2 Film"

D. Lee, G.H. Park, S.H. Kim, K.Yang, J. Lee, H. Choi, Y. Lee, J.J. Ryu, J.I. Lee, G.H. Kim*, M.H. Park,

IEEE ELECTRON DEVICE LETTERS 

10.1109/LED.2023.3294522 

 

72      "Wake-up-mitigated giant ferroelectricity in Hf0.5Zr0.5O2 thin films through oxygen-providing, surface-oxidized W electrode"

K. Yang, G.Y. Kim, J.J. Ryu, D. Lee, J.Y. Park, S.H. Kim, G.H. Park, G.T. Yu, G.H. Kim*, S.Y. Choi, M.H. Park,

Materials Science in Semiconductor Processing 

https://doi.org/10.1016/j.mssp.2023.107565 

 

71      "Analogue Artificial Synaptic Performance of Self-rectifying Resistive Switching Device"

H.K. Seo, J.J Ryu, S.Y. Lee, K. Jeon, H. Sohn, G.H. Kim*, M.K. Yang, 

Advanced Electronic Materials 

https://doi.org/10.1002/aelm.202300165

 

2022


70      “Threshold switching in chalcogenide GeTe and GeTeS thin films prepared via plasma enhanced atomic layer deposition”

J.J Ryu, K. Jeon, H. Sohn, G.H. Kim*,

Journal of Materials Chemistry C

10.1039/D2TC03656H 

 

69      “Dot-product operation in crossbar array using a self-rectifying resistive device”

K. Jeon, J.J Ryu, D.S. Jeong, G.H. Kim*

Advanced Materials Interfaces 

https://doi.org/10.1002/admi.202200392 

 

68      “Material and structural engineering of ovonic threshold switch for highly reliable performance”

H.K. Seo, J.J Ryu, S.Y. Lee, M. Park, S.G. Park, W. Song, G.H. Kim*, M.K. Yang,

Advanced Electronic Materials

https://doi.org/10.1002/aelm.202200161 

 

67      “Energy conversion and storage using artificially induced antiferroelectricity in HfO2/ZrO2 nanolaminates”

K. Yang, E.B. Lee, D. Lee, J.Y. Park, S.H. Kim, G.H. Park, G.T. Yu, J.I. Lee, G.H. Kim*, M.H. Park, 

Composites Part B 

https://doi.org/10.1016/j.compositesb.2022.109824 

 

2021


66      “Improved switching and synapse characteristics using PEALD SiO2 thin film in Cu/SiO2/ZrO2/Pt device”

D. Lee, A.S. Sokolov, B. Ku, Y.R. Jeon, D.H. Kim, H.T. Kim, G.H. Kim*, C.H. Choi, 

Applied Surface Science

https://doi.org/10.1016/j.apsusc.2021.149140 

 

65      “Atomic layer deposition of a ruthenium thin film using a precursor with enhanced reactivity”

J.M. Hwang, S.M. Han, H. Yang, S. Yeo, S.H. Lee, C.W. Park, G.H. Kim, B.K. Park, Y. Byun, T. Eom, T.M. Chung,

Journal of Materials Chemistry C

10.1039/D0TC05682K 

 

64      “Self-rectifying resistive memory in passive crossbar arrays”

K. Jeon, J. Kim, J.J. Ryu, S. Yoo, C. Song, M.K. Yang, D.S. Jeong, G.H. Kim*,

Nature Communications

https://doi.org/10.1038/s41467-021-23180-2 

 

63      “Effect of residual impurities on polarization switching kinetics in atomic-layer-deposited ferroelectric Hf0.5Zr0.5O2 thin films”

D.H. Lee, G.T. Yu, J.Y. Park, S.H. Kim, K. Yang, G.H. Park, J.J. Ryu, J.I. Lee, G.H. Kim*, M.H. Park,

Acta Materialia

https://doi.org/10.1016/j.actamat.2021.117405

 

62      “Strategic allocation of two-dimensional van der Waals semiconductor as an oxygen reservoir for boosting resistive switching reliability” 

S. Yoo, R.E. Agbenyeke, H. Choi, K. Jeon, J.J. Ryu, T. Eom, B.K. Park, T.M. Chung, D.S. Jeong, W. Song, G.H. Kim*

Applied Surface Science

https://doi.org/10.1016/j.apsusc.2021.151936 

 

2020


61      “Ti-doped alumina based reliable resistive switching in sub-μA regime”

D.K. Lee, G.H. Kim, H. Sohn, M.K. Yang

Applied Physics Letters

https://doi.org/10.1063/5.0011310

 

60      “Highly Linear and Symmetric Weight Modification in HfO2Based Memristive Devices for HighPrecision Weight Entries”

J.J. Ryu, K. Jeon, G. Kim, M.K. Yang, C. Kim, D.S. Jeong, G.H. Kim*
  Advanced Electronic Materials
  https://doi.org/10.1002/aelm.202000434

 

59      “IR-QNN framework: An IR drop-aware offline training of quantized crossbar arrays”

M.E. Fouda, S. Lee, J. Lee, G.H. Kim, F. Kurdahi, A.M. Eltawi
  IEEE Access
  https://doi.org/10.1109/ACCESS.2020.3044652

 

2019


58      “Fully “Erase-free” Multi-Bit Operation in HfO2-Based Resistive Switching Device”

J.J. Ryu, K. Jeon, S. Yeo, G. Lee, C. Kim, G.H. Kim*

ACS Applied Materials & Interfaces
  https://doi.org/10.1021/acsami.8b20035

 

57      “Role of an Interfacial Layer in Ta2O5-Based Resistive Switching Devices for Improved Endurance and Reliable Multibit Operation”

D.K. Lee, G.H. Kim, H. Sohn, M.K. Yang

Physica Status SolidiRapid Research Letters

https://doi.org/10.1002/pssr.201900646

 

56      “Positive effects of a Schottky-type diode on unidirectional resistive switching devices”

D.K. Lee, G.H. Kim, H. Sohn, M.K. Yang

Applied Physics Letters

https://doi.org/10.1063/1.5133868

 

55      “Improved resistive switching behavior of multiwalled carbon nanotube/TiO2 nanorods composite film by increased oxygen vacancy reservoir”

N. Mullani, I. Ali, T.D. Dongale, G.H. Kim, B.J. Choi, M.A. Basit, T.J. Park

Materials Science in Semiconductor Processing

https://doi.org/10.1016/j.mssp.2019.104907

 

2018


54      “Band gap engineering of atomic layer deposited ZnxSn1-xO buffer for efficient Cu(In,Ga)Se2 solar cell”

R.E. Agbenyeke, S. Song, B.K. Park, G.H. Kim, J.H. Yun, T.M. Chung, C.G. Kim, J.H. Han

Progress in Photovoltaics: Research and Applications

https://doi.org/10.1002/pip.3012

 

53      “PostAnnealing Effect on Resistive Switching Performance of a Ta/Mn2O3/Pt/Ti Stacked Device”

M.K. Yang, G.H. Kim*
  Physica Status SolidiRapid Research Letters
  https://doi.org/10.1002/pssr.201800031

 

52      “Optimized Method for LowEnergy and Highly Reliable Multibit Operation in a HfO2Based Resistive Switching Device”

J.J. Ryu, B.K. Park, T.K. Chung, Y.K. Lee, G.H. Kim*

Advanced Electronic Materials

https://doi.org/10.1002/aelm.201800261

 

51      “Phase-controlled SnO2 and SnO growth by atomic layer deposition using Bis (N-ethoxy-2, 2-dimethyl propanamido) tin precursor”

H.Y. Kim, J.H. Nam, S.M. George, J.S. Park, B.K. Park, G.H. Kim, D.J. Jeon, T.M. Chung, J.H. Han
  Ceramics International
  https://doi.org/10.1016/j.ceramint.2018.09.263

 

2017


50      "Four-Bits-Per-Cell Operation in an HfO2-Based Resistive Switching Device"

G.H. Kim, H. Ju, M.K. Yang, D.K. Lee, J.W. Choi, J.H. Jang, S. Lee, I.S. Cha, B.K. Park, J.H. Han, T.M. Chung, K.M. Kim, C.S. Hwang, Y.K. Lee,

Small

https://doi.org/10.1002/smll.201701781

 

49      "Basic ammonothermal growth of bulk GaN single crystal using sodium mineralizers"

J.B. Shim, G.H. Kim, Y.K. Lee,

Journal of Crystal Growth

https://doi.org/10.1016/j.jcrysgro.2017.08.027

 

48      "Double-Layer-Stacked One Diode-One Resistive Switching Memory Crossbar Array with an Extremely High Rectification Ratio of 109"

K.J. Yoon, G.H. Kim, S. Yoo, W. Bae, J.H. Yoon, T.H. Park, D.E. Kwon, Y.J. Kwon, H.J. Kim, Y.M. Kim, C.S.Hwang,

Advanced Electronic Materials

https://doi.org/10.1002/aelm.201700152

 

47      "Improvement of thermoelectric properties of Bi2Te3 and Sb2Te3 films grown on graphene substrate"

C.W. Lee, G.H. Kim, J.W. Choi, K.S. An, J. Kim, H. Kim, Y.K. Lee,

Physica Status SolidiRapid Research Letters

https://doi.org/10.1002/pssr.201700029

 

46      "Growth behavior of Bi2Te3 and Sb2Te3 thin films on graphene substrate grown by plasma-enhanced chemical vapor deposition"

C.W. Lee, G.H. Kim, S.G. Kang, M.A. Kang, K.S. An, H. Kim, Y.K. Lee,

Physica Status SolidiRapid Research Letters

https://doi.org/10.1002/pssr.201600369 

 

2015


45      "Direct evidence on Ta-Metal Phases Igniting Resistive Switching in TaOx Thin Film"

M.K. Yang, H. Ju, G.H. Kim, J.K. Lee, H.C. Ryu,

Scientific Reports

https://doi.org/10.1038/srep14053

 

44      "The interfacial layer effect on bi-stable resistive switching phenomenon in MnOx thin film"

M.K. Yang, G.H. Kim, H. Ju, J.K. Lee, H.C. Ryu,

Applied Physics Letters

https://doi.org/10.1063/1.4928249

 

43      "An analysis of “non-lattice” oxygen concentration effect on electrical endurance characteristic in resistive switching MnOx thin film"

M.K. Yang, G.H. Kim, H. Ju, J.K. Lee, H.C. Ryu,

Applied Physics Letters            

https://doi.org/10.1063/1.4907704 

 

2014


42      "A Review of Three-Dimensional Resistive Switching Cross-Bar Array Memories from the Integration and Materials Property Points of View"

J.Y. Seok, S.J. Song, J.H. Yoon, K.J. Yoon, T.H. Park, D.E. Kwon, H. Lim, G.H. Kim, D.S. Jeong, C.S. Hwang,

Advanced Functional Materials

https://doi.org/10.1002/adfm.201303520 

 

2013

41      "Real-time identification of the evolution of conducting nano-filaments in TiO2 thin film ReRAM"

S.J. Song, J.Y. Seok, J.H. Yoon, K.M. Kim, G.H. Kim, M.H. Lee, C.S. Hwang,

Scientific Reports          

https://doi.org/10.1038/srep03443

 

40      "Electrode Engineering for Improving Resistance Switching of Sb2O5 Films"

Y. Ahn, Y.J. Choi, J.W. Park, J.H. Lee, G.H. Kim, Y.S. Kim, J. Heo, H.J. Kim, C.S. Hwang,

Applied Physics Express

https://doi.org/10.7567/APEX.6.091102

 

39      "Ionic bipolar resistive switching modes determined by the preceding unipolar resistive switching reset behavior in Pt/TiO2/Pt"

K.J. Yoon, S.J. Song, J.Y. Seok, J.H. Yoon, G.H. Kim, J.H. Lee, C.S. Hwang, Nanotechnology

https://doi.org/10.1088/0957-4484/24/14/145201

 

38      "Highly Improved Uniformity in the Resistive Switching Parameters of TiO2 Thin Films by Inserting Ru Nanodots"

J.H. Yoon, J.H. Han, J.S. Jung, W. Jeon, G.H. Kim, S.J. Song, J.Y. Seok, K.J. Yoon, M.H. Lee, C.S. Hwang,

Advanced Materials

https://doi.org/10.1002/adma.201204572 

 

2012


37      "Concurrent presence of unipolar and bipolar resistive switching phenomena in pnictogen oxide Sb2O5 films"

Y. Ahn, J.H. Lee, G.H. Kim, J.W. Park, J. Heo, S.W. Ryu, Y.S Kim, C.S. Hwang, H.J. Kim,

Journal of Applied Physics

https://doi.org/10.1063/1.4767918

 

36      "Substrate Dependent Growth Behaviors of Plasma-Enhanced Atomic Layer Deposited Nickel Oxide Films for Resistive Switching Application"

S.J. Song, S.W. Lee, G.H. Kim, J.Y. Seok, K.J. Yoon, J.H. Yoon, C.S. Hwang, J. G, C.H. Ko,

Chemistry of Materials

https://doi.org/10.1021/cm302182s

 

35      "Unipolar resistive switching characteristics of pnictogen oxide films: Case study of Sb2O5"

Y. Ahn, S.W. Ryu, J.H. Lee, J.W. Park, G.H. Kim, Y.S. Kim, J. Heo, C.S. Hwang, H.J. Kim,

Journal of Applied Physics                   

https://doi.org/10.1063/1.4766415

 

34      "32x32 Crossbar Array Resistive Memory Composed of a Stacked Schottky Diode and Unipolar Resistive Memomry"

G.H. Kim, J.H. Lee, Y. Ahn, W. Jeon, S.J. Song, J.Y. Seok, J.H. Yoon, K.J. Yoon, T.J. Park, C.S. Hwang

Advanced Functional Materials

https://doi.org/10.1002/adfm.201202170

 

33      "Optimization of Chemical Structure of Schottky-Type Selection Diode for Crossbar Resistive Memory"

G.H. Kim, J.H. Lee, W. Jeon, S.J. Song, J.Y. Seok, J.H. Yoon, K.J Yoon, T.J Park, C.S. Hwang,

ACS Applied Materials & Interfaces

https://doi.org/10.1021/am301293v

 

32      "Schottky diode with excellent performance for large integration density of crossbar resistive memory"

G.H. Kim, J.H. Lee, J.H. Han, S.J. Song, J.Y. Seok, J.H. Yoon, K.J. Yoon, M.H. Lee, T.J. Park, C.S. Hwang,

Applied Physics Letters

https://doi.org/10.1063/1.4722784

 

31      "Memristive tri-stable resistive switching at ruptured conducting filaments of a Pt/TiO2/Pt cell"

K.J. Yoon, M.H. Lee, G.H. Kim, S.J. Song, J.Y. Seok, S. Han, J.H. Yoon, K.M. Kim, C.S. Hwang,

Nanotechnology

https://doi.org/10.1088/0957-4484/23/18/185202

 

30      "Threshold switching in Si-As-Te thin film for the selector device of crossbar resistive memory"

J.H. Lee, G.H. Kim, Y.B Ahn, J.W. Park, S.W Ryu, C.S Hwang, H.J Kim,
  Applied Physics Letters

https://doi.org/10.1063/1.3696077

 

29      "Resistive Switching in TiO2 Thin Films Using the Semiconducting In-Ga-Zn-O Electrode"

J.Y. Seok, G.H. Kim, J.H. Kim U.K. Kim, Y.- J. Chung, S.J. Song, J.H. Yoon, K.J Yoon, M.H. Lee, K.M. Kim, C.S. Hwang,

IEEE Electron Device Letters

https://doi.org/10.1109/LED.2011.2182175

 

2011


28      “Surface redox induced bipolar switching of transition metal oxide films examined by scanning probe microscopy”

M.H. Lee, K.M. Kim, S.J. Song, S.H. Rha, J.Y. Seok, J.S. Jung, G.H. Kim, J.H. Yoon, C.S. Hwang

Applied Physics AMATERIALS SCIENCE & PROCESSING

https://doi.org/10.1007/s00339-011-6266-7

 

27      “Collective Motion of Conducting Filaments in Pt/n-Type TiO2/p-Type NiO/Pt Stacked Resistance Switching Memory”

K.M. Kim, S.J. Song, G.H. Kim, J.Y. Seok, M.H. Lee, J.H. Yoon, J. Park, C.S. Hwang

Advanced Functional Materials

https://doi.org/10.1002/adfm.201002282

 

26      “Local Epitaxial Growth of Ru Thin Films by Atomic Layer Deposition at Low Temperature”

S.K. Kim, S. Han, G.H. Kim, J.H. Jang, J.H. Han, C.S, Hwang

Journal of The Electrochemical Society

https://doi.org/10.1149/1.3596018

 

25      “SiO2 doped Ge2Sb2Te5 thin films with high thermal efficiency for applications in phase change random access memory”

S.W. Ryu, H.K. Lyeo, J.H. Lee, Y.B. Ahn, G.H. Kim, C.H. Kim, S.G. Kim, S.H. Lee, K.Y. Kim, J.H. Kim

Nanotechnology

https://doi.org/10.1088/0957-4484/22/25/254005

 

24      “A detailed understanding of the electronic bipolar resistance switching behavior in Pt/TiO2/Pt structure”

K.M. Kim, B.J. Choi, M.H. Lee, G.H. Kim, S.J. Song, J.Y. Seok, J.H. Yoon, S. Han, C.S. Hwang

Nanotechnology

https://doi.org/10.1088/0957-4484/22/25/254010

 

23      “Improved endurance of resistive switching TiO2 thin film by hourglass shaped Magnéli filaments”

G.H. Kim, J.H. Lee, J.Y. Seok, S.J. Song, J.H. Yoon, K.J. Yoon, M.H. Lee, K.M. Kim, H.D, Lee, S.W. Ryu, T.J. Park

Applied Physics Letters

https://doi.org/10.1063/1.3600784

 

22      “Polarization switching and discharging behaviors in serially connected ferroelectric Pt/Pb(Zr,Ti)O3/Pt and paraelectric capacitors”

H.J. Lee, M.H. Park, G.H. Kim, J.Y. Seok, Y.J. Kim, C.S. Hwang, A.Q. Jiang

Journal of Applied Physics

https://doi.org/10.1063/1.3597816

 

21      “Tristate Memory Using Ferroelectric–Insulator–Semiconductor Heterojunctions for 50% Increased Data Storage”

M.H. Park, H.J. Lee, G.H. Kim, Y.J. Kim, J.H. Kim, J.H. Lee

Advanced Functional Materials

https://doi.org/10.1002/adfm.201101073

 

2010


20      “Role of Ru nano-dots embedded in TiO2 thin films for improving the resistive switching behavior”

J.H. Yoon, K.M. Kim, M.H. Lee, S.K. Kim, G.H. Kim, S.J. Song, J.Y. Seok, C.S. Hwang,

Applied Physics Letters

https://doi.org/10.1063/1.3525801

 

19      “Understanding structure-property relationship of resistive switching oxide thin films using a conical filament model”

K.M. Kim, M.H. Lee, G.H. Kim, S.J. Song, J.Y. Seok, J.H. Yoon, C.S. Hwang,

Applied Physics Letters

https://doi.org/10.1063/1.3505354

 

18      A theoretical model for Schottky diodes for excluding the sneak current in cross bar array resistive memory”

G.H. Kim*, K.M. Kim, J.Y. Seok, H.J. Lee, D.Y. Cho, J.H. Han, C.S. Hwang,

Nanotechnology

https://doi.org/10.1088/0957-4484/21/38/385202

 

17      Influence of the Interconnection Line Resistance and Performance of a Resistive Cross Bar Array Memory”

G.H. Kim, K.M. Kim, J.Y. Seok, M.H. Lee, S.J. Song, C.S. Hwang,

Journal of The Electrochemical Society

https://doi.org/10.1149/1.3478143

                                                                                                                                 

16      “Scanning probe based observation of bipolar resistive switching NiO films”

M.H. Lee, S.J. Song, K.M. Kim, G.H. Kim, J.Y. Seok, J.H. Yoon, C.S. Hwang,

Applied Physics Letters

https://doi.org/10.1063/1.3479526

   

15      Electrically configurable electroforming and bipolar resistive switching in Pt/TiO2/Pt structures”

K.M. Kim, G.H. Kim, S.J. Song, J.Y. Seok, M.H. Lee, J.H. Yoon, C.S. Hwang,

Nanotechnology

https://doi.org/10.1088/0957-4484/21/30/305203

 

14      “Bias polarity dependent local electrical conduction in resistive switching TiO2 thin films”

Y.C. Shin, M.H. Lee, K.M. Kim, G.H. Kim, S.J. Song, J.Y. Seok, C.S. Hwang,

Physica Status SolidiRapid Research Letters

https://doi.org/10.1002/pssr.201004066

 

13      “Polarization reversal behavior in the Pt/Pb(Zr,Ti)O3/Pt and Pt/Al2O3/Pb(Zr,Ti)O3/Pt capacitors for different reversal directions”

H.J. Lee, G.H. Kim, M.H. Park, A.Q. Jiang, C.S. Hwang,

Applied Physics Letters

https://doi.org/10.1063/1.3435484

 

12      A Pt/TiO2/Ti SchottkyType selection diode for alleviating the sneak current in resistance switching memory arrays”

W.Y. Park, G.H. Kim, J.Y. Seok, K.M. Kim, S.J. Song, M.H. Lee, C.S. Hwang,

Nanotechnology

https://doi.org/10.1088/0957-4484/21/19/195201

 

11      “Study on the electrical conduction mechanism of bipolar resistive switching TiO2 thin films using impedance spectroscopy”

M.H. Lee, K.M. Kim, G.H. Kim, J.Y. Seok, S.J. Song, J.H. Yoon, C.S. Hwang,

Applied Physics Letters

https://doi.org/10.1063/1.3400222

   

10      “Investigation on the Growth Initiation of Ru Thin Films by Atomic Layer Deposition”

S.K. Kim, J.H. Han, G.H. Kim, C.S. Hwang,

Chemistry of Materials

https://doi.org/10.1021/cm100057y

 

9        “Methods of Set Switching for Improving the Uniformity of Filament Formation in the TiO2 Thin Film”

K.M. Kim, S.J. Song, G.H. Kim, J.Y. Seok, M.H. Lee, J.S. Zhao, C.S. Hwang,

Electrochemical and Solid State Letters

https://doi.org/10.1149/1.3369469 

 

8        “Identification of the controlling parameter for the set-state resistance of a TiO2 resistive switching cell”

S.J. Song, K.M. Kim, G.H. Kim, M.H. Lee, J.Y. Seok, R.J. Jung, C.S. Hwang,

Applied Physics Letters

https://doi.org/10.1063/1.3355415

 

7        “Atomic structure of conducting nanofilaments in TiO2 resistive switching memory”

D.H. Kwon, K.M. Kim, J.H. Jang, J.M. Jeon, M.H. Lee, G.H. Kim, X.S. Li, G.S. Park, B.R. Lee, S.W. Han, M.Y. Kim, C.S. Hwang,

Nature Nanotechnology

https://doi.org/10.1038/nnano.2009.456

 

2009


6        “An analysis of imprinted hysteresis loops for a ferroelectric Pb(Zr,Ti)O3 thin film capacitor using the switching transient current measurements”

G.H. Kim, H.J. Lee, A.Q. Jiang, M.H. Park, C.S. Hwang

Journal of Applied Physics

https://doi.org/10.1063/1.3078104

 

5        “The Inlaid Al2O3 Tunnel Switch for Ultrathin Ferroelectric Films”

A.Q. Jiang, H.J. Lee, G.H. Kim, C.S. Hwang,

Advanced Materials

https://doi.org/10.1002/adma.200802924

 

4        “The reason for the increased threshold switching voltage of SiO2 doped Ge2Sb2Te5 thin films for phase change random access memory”

S.W. Ryu, J.H. Lee, Y.B. Ahn, C.H. Kim, B.S. Yang, G.H. Kim, S.G. Kim, S.H. Lee, C.S. Hwang, H.J. Kim,

Applied Physics Letters

https://doi.org/10.1063/1.3232237

 

3        “Filamentary Resistive Switching Localized at Cathode Interface in NiO Thin Films”

K.M. Kim, B.J. Choi, S.J. Song, G.H. Kim, C.S. Hwang

Journal of The Electrochemical Society

https://doi.org/10.1149/1.3240201

 

2008


2        “(In,Sn)2O3/TiO2/Pt Schottky-type diode switch for the TiO2 resistive switching memory array”

Y.C. Shin, J. Song, K.M. Kim, B.J. Choi, S. Choi, H.J. Lee, G.H. Kim, T. Eom, C.S. Hwang

Applied Physics Letters

https://doi.org/10.1063/1.2912531

 

2007


1        “Initial Growth Behavior of a Lead Oxide Thin Film on Ir Substrates by Atomic Layer Deposition”

H.J. Lee, G.H. Kim, K. Lee, C.S. Hwang

Electrochemical and Solid State Letters

https://doi.org/10.1149/1.2789286